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Proceedings Paper

X-ray reflectivity measurements at chromium-iridium tri-layer coatings
Author(s): Veronika Stehlíkova; Thorsten Döhring; Tobias Schäfer; Manfred Stollenwerk; Peter Friedrich; Vadim Burwitz; Gisela Hartner; Miranda Bradshaw; Yingyu Liao; Carlo Pelliciari
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Paper Abstract

Studying astronomical objects in the X-ray regime, iridium-based layer systems are highly effective reflective materials for telescopes mirrors. Aschaffenburg University and the Czech Technical University in Prague jointly developed stress compensated chromium-iridium coatings. To overcome the disturbing reflectivity reduction of the iridium absorption edge around 2 keV photon energy and improve general reflectivity at lower incident energies, thin overcoat layers of chromium have been applied in addition. Corresponding measurements at several X-ray lines have been performed on these samples at the PANTER test facility of the Max-Planck Institute for extraterrestrial Physics. A part of the experimental results and their comparison with theoretical simulations are presented in this contribution.

Paper Details

Date Published: 9 September 2019
PDF: 6 pages
Proc. SPIE 11119, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, 111191L (9 September 2019); doi: 10.1117/12.2530439
Show Author Affiliations
Veronika Stehlíkova, Max-Planck-Institut für extraterrestrische Physik (Germany)
Thorsten Döhring, Hochschule Aschaffenburg (Germany)
Tobias Schäfer, Hochschule Aschaffenburg (Germany)
Manfred Stollenwerk, Hochschule Aschaffenburg (Germany)
Peter Friedrich, Max-Planck-Institut für extraterrestrische Physik (Germany)
Vadim Burwitz, Max-Planck-Institut für extraterrestrische Physik (Germany)
Gisela Hartner, Max-Planck-Institut für extraterrestrische Physik (Germany)
Miranda Bradshaw, Max-Planck-Institut für extraterrestrische Physik (Germany)
Yingyu Liao, Max-Planck-Institut für extraterrestrische Physik (Germany)
Carlo Pelliciari, Max-Planck-Institut für extraterrestrische Physik (Germany)


Published in SPIE Proceedings Vol. 11119:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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