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Measurement of errors by axial misalignment and tilt of the null screen used in experimental arrangements by deflectometry
Author(s): Diana Castán-Ricaño; Fermín Granados-Agustín; Andrea Muñoz-Potosi; Gabriel Valdivieso-González; Elizabeth Percino-Zacarías; Maximino Avendaño-Alejo; Alejandro Cornejo-Rodríguez
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Paper Abstract

To measure the quality of optical surfaces, one of the most used methods is the deflectometry. To implement this technique, a screen is used to choose some incident rays on the surface under test. Subsequently, the intersection of the rays is measured, after having passed through the surface, in a detection plane perpendicular to the optical axis. With the coordinates of the points in the detection plane, the normal vectors are determined in each point of the surface under test. The process is simple if the incident rays are chosen in a configuration called null, that is, in the detection plane the measured points will be distributed in a uniform configuration, rectangular, circular, radial, etc. In this work we present the numerical simulations, considering an incident spherical wavefront in the null screen that is placed at an arbitrary position between the source and the flat surface of an aspheric lens that was used in the experimental arrangement. In the simulations it is expected to obtain a uniformly distributed arrangement of spots, which will be compared with the experimental results.

Paper Details

Date Published: 21 June 2019
PDF: 9 pages
Proc. SPIE 11057, Modeling Aspects in Optical Metrology VII, 110571S (21 June 2019); doi: 10.1117/12.2530400
Show Author Affiliations
Diana Castán-Ricaño, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Fermín Granados-Agustín, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Andrea Muñoz-Potosi, Univ. de Investigación y Desarrollo (Colombia)
Gabriel Valdivieso-González, Univ. de Investigación y Desarrollo (Colombia)
Elizabeth Percino-Zacarías, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Maximino Avendaño-Alejo, Univ. Nacional Autónoma de México (Mexico)
Alejandro Cornejo-Rodríguez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)


Published in SPIE Proceedings Vol. 11057:
Modeling Aspects in Optical Metrology VII
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)

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