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Fabrication of monocrystalline silicon x-ray mirrors
Author(s): Raul E. Riveros; Michael P. Biskach; Kim D. Allgood; John D. Kearney; Michal Hlinka; Ai Numata; William W. Zhang
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Paper Abstract

Progress within the field of x-ray astronomy depends on astronomical x-ray observations of ever-increasing quality and speed. Fast and high-resolution x-ray observations over a broad spectral range promise amazing new discoveries. These observations, however, require a spaceborne x-ray telescope of unprecedented imaging power. Of the numerous technological concerns associated with the design and construction of such a telescope, the x-ray focusing optics present a particularly complex and arduous set of challenges. An x-ray optical assembly comprises many thousands of x-ray mirrors, a most critical element. Our group at NASA Goddard Space Flight Center (GSFC) pursues the development of an x-ray mirror manufacturing process capable of meeting the stringent quality, production time, and cost requirements of the next-generation of x-ray telescopes. The manufacturing process employs monocrystalline silicon: a lightweight, stiff, thermally conductive, and readily available material which is free of internal stress; it is a nearly ideal material for a thin mirror substrate. The process involves various traditional optical fabrication techniques adapted to x-ray mirror geometry. Presently, our process is capable of fabricating sub-arcsecond half-powerdiameter (HPD) resolution mirror pairs (primary and secondary) at a mirror thickness of 0.5 mm and of virtually any x-ray optical design (e.g. Wolter-I, Wolter-Schwarzschild, etc.). The mirror substrate surface quality is comparable to, and sometimes exceeding, that of the mirrors on the Chandra X-ray Observatory. This paper describes the various manufacturing steps involved in the production of x-ray mirror substrates and a present status report.

Paper Details

Date Published: 9 September 2019
PDF: 8 pages
Proc. SPIE 11119, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, 1111908 (9 September 2019); doi: 10.1117/12.2530343
Show Author Affiliations
Raul E. Riveros, NASA Goddard Space Flight Ctr. (United States)
Univ. of Maryland, Baltimore County (United States)
Michael P. Biskach, NASA Goddard Space Flight Ctr. (United States)
KBR, Inc. (United States)
Kim D. Allgood, NASA Goddard Space Flight Ctr. (United States)
KBR, Inc. (United States)
John D. Kearney, NASA Goddard Space Flight Ctr. (United States)
KBR, Inc. (United States)
Michal Hlinka, NASA Goddard Space Flight Ctr. (United States)
KBR, Inc. (United States)
Ai Numata, NASA Goddard Space Flight Ctr. (United States)
KBR, Inc. (United States)
William W. Zhang, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 11119:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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