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Proceedings Paper

Recent trends in high-resolution hard x-ray tomography
Author(s): Bert Müller
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Paper Abstract

Hard X rays are the probe of choice to three-dimensionally visualize optically opaque hard and soft objects as well as their combinations without physical cutting. The currently available methods allow for the quantification of the real and the imaginary parts of local refractive indices. The related phase- and absorption-contrast data are often complementary. The datasets are of GB or TB size due to the object's size and the selected spatial resolution. Therefore the related quantification is challenging. Nevertheless, the current developments pave the way towards imaging larger and larger objects with true micro- and nanometer resolution. Since 1997, the SPIE conference on Developments in X-ray Tomography, which was established by U. Bonse, has set the benchmark in the dissemination of knowledge between experts in instrumentation, software development, and a variety of applications. This paper summarizes key aspects of the contributions in the current volume.

Paper Details

Date Published: 15 October 2019
PDF: 15 pages
Proc. SPIE 11113, Developments in X-Ray Tomography XII, 1111302 (15 October 2019); doi: 10.1117/12.2530085
Show Author Affiliations
Bert Müller, Univ. Basel (Switzerland)

Published in SPIE Proceedings Vol. 11113:
Developments in X-Ray Tomography XII
Bert Müller; Ge Wang, Editor(s)

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