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MVIC engineering array characterization in the SwRI detector calibration lab
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Paper Abstract

The SwRI Detector Characterization Lab (SDCL) was established in order to facilitate the rapid calibration of large numbers of detector arrays for upcoming ground and space missions. The SDCL is equipped with a McPherson monochromator with exchangeable gratings and light sources enabling wavelength coverage from 0.3 to 5.0 micron at sub nanometer resolution. The SDCL also has cryostats capable of maintaining thermal control of detector subassemblies and transfer optics to a precision of 0.1K at 77K and 0.01K at 4K. Using this calibration system, we have calibrated the EEM and ETU detector for read noise, dark current, modulation transfer function, quantum efficiency, cross talk, and total system throughput. The data were collected using standard Photon Transfer Curve techniques at the various wavelengths corresponding to the MVIC filter bandpasses. Here, we will present the data for the engineering unit, the methodology used to perform the calibration, and the steps forward for calibration of the flight unit.

Paper Details

Date Published: 9 September 2019
PDF: 9 pages
Proc. SPIE 11115, UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts IX, 111151A (9 September 2019); doi: 10.1117/12.2530005
Show Author Affiliations
Todd J. Veach, Southwest Research Institute (United States)
Amanda J. Bayless, Southwest Research Institute (United States)
Peter W. Roming, Southwest Research Institute (United States)
Greg Bredthauer, Semiconductor Technology Associates, Inc. (United States)
Joseph Tufts, Semiconductor Technology Associates, Inc. (United States)


Published in SPIE Proceedings Vol. 11115:
UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts IX
Allison A. Barto; James B. Breckinridge; H. Philip Stahl, Editor(s)

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