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Proceedings Paper

High-speed characterization of refractive lenses with single-grating interferometry
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Paper Abstract

Compound refractive lenses (CRLs) are widely used as focusing optics at X-ray synchrotron beamlines. For example, the Advanced Photon Source Upgrade (APS-U) beamlines will utilize a large number of CRLs. These lenses must be of high quality to preserve the wavefront and coherence properties of the new source. Therefore, they must be evaluated for quality control and performance before installation and use. At the APS, singlegrating Talbot interferometry has been the primary at-wavelength characterization method because of its high speed, and the ability to provide accurate, quantitative measurements. However, even though the measurement of a single lens is fast, the characterization of a large number of lenses is time consuming due to the time spent on mounting and alignment of individual samples. To adapt the method for testing large quantities of lenses, a fast evaluation system was developed, which includes the use of a lens cartridge for rapid sample change and alignment and an automated python script for batch data analysis. In this work, the optical specifications of refractive lenses are discussed. Measurement and data analysis procedures are also shown in details for testing individual lenses.

Paper Details

Date Published: 9 September 2019
PDF: 8 pages
Proc. SPIE 11109, Advances in Metrology for X-Ray and EUV Optics VIII, 111090K (9 September 2019); doi: 10.1117/12.2529886
Show Author Affiliations
Xianbo Shi, Argonne National Lab. (United States)
Walan Grizolli, Argonne National Lab. (United States)
Deming Shu, Argonne National Lab. (United States)
Luca Rebuffi, Argonne National Lab. (United States)
Zahirul Islam, Argonne National Lab. (United States)
Lahsen Assoufid, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 11109:
Advances in Metrology for X-Ray and EUV Optics VIII
Lahsen Assoufid; Haruhiko Ohashi; Anand Asundi, Editor(s)

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