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Proceedings Paper

Design techniques used to minimize impact of SEU's targeting microsemi FPGA's at the NIF target chamber
Author(s): Bruce Dean; Matthew Dayton; Chris Macaraeg; Brad Funsten
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Paper Abstract

The National Ignition Facility’s (NIF) high-yield DT shots create a harsh radiation environment that can cause electronics to malfunction. This paper documents various design tradeoffs and techniques used for a Microsemi FPGA to reduce the impact of Single Event Upsets (SEUs) that enable a camera to capture images in the NIF target chamber during a high-yield shot.

Paper Details

Date Published: 25 October 2019
PDF: 13 pages
Proc. SPIE 11114, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXI, 1111418 (25 October 2019);
Show Author Affiliations
Bruce Dean, Lawrence Livermore National Lab. (United States)
Matthew Dayton, Lawrence Livermore National Lab. (United States)
Chris Macaraeg, Lawrence Livermore National Lab. (United States)
Brad Funsten, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 11114:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXI
Ralph B. James; Arnold Burger; Stephen A. Payne, Editor(s)

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