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Proceedings Paper

Instrumentation and method developments of x-ray ptychography at the Advanced Photon Source
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Paper Abstract

Among different techniques based on x-ray nanoimaging, ptychography has become a popular tool to study specimens at nanometer-scale resolution without the need of using high-resolution optics that requires very stringent manufacturing processes. This high-resolution imaging method is compatible with other imaging modalities acquired in scanning microscopy. At the Advance Photon Source (APS), we have developed two fluorescence microscopes for simultaneous ptychography and fluorescence imaging which together provide a powerful technique to study samples in biology, environmental science, and materials science. Combined with different tilted sample projections, such correlative methods can yield high-resolution 3D structural and chemical images. More recent work has been focused on the development of a fast ptychography instrument called the Velociprobe which is built to take advantage of the over 100 times higher coherent flux provided by the coming APS upgrade source. The Velociprobe uses high-bandwidth accurate interferometry and advanced motion controls with fast continuous scanning schemes which are optimized for large-scale samples and 3D high-resolution imaging. This instrument has been demonstrated to obtain sub-10 nm resolution with different high-photon-efficient scanning schemes using fast data acquisition rate up to 3 kHz (currently limited by detector's full continuous frame rate). A ptychographic imaging rate of 100 _m2/second with a sub-20 nm spatial resolution was shown in this paper.

Paper Details

Date Published: 9 September 2019
PDF: 9 pages
Proc. SPIE 11112, X-Ray Nanoimaging: Instruments and Methods IV, 111120E (9 September 2019); doi: 10.1117/12.2529805
Show Author Affiliations
Junjing Deng, Argonne National Lab. (United States)
Yudong Yao, Argonne National Lab. (United States)
Yi Jiang, Argonne National Lab. (United States)
Si Chen, Argonne National Lab. (United States)
Jeffrey A. Klug, Argonne National Lab. (United States)
Michael Wojcik, Argonne National Lab. (United States)
Fabricio S. Marin, Argonne National Lab. (United States)
Curt Preissner, Argonne National Lab. (United States)
Christian Roehrig, Argonne National Lab. (United States)
Zhonghou Cai, Argonne National Lab. (United States)
Stefan Vogt, Argonne National Lab. (United States)
Barry Lai, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 11112:
X-Ray Nanoimaging: Instruments and Methods IV
Barry Lai; Andrea Somogyi, Editor(s)

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