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Proceedings Paper

Retardance parameters measurements by employing a rotating polarizer-analyzer polarimeter
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Paper Abstract

In this work, we proposed the usage of a rotating polarizer-analyzer polarimeter to retrieve retardance parameters of a sample by treating it as an elliptical retarder that can be characterized by three parameters: total retardance, fast axis orientation and an ellipticity related parameter. By employing the Mueller matrix approach, we developed the demodulation algorithm to retrieve each parameter with the association of the Fourier series analysis. We present experimental results considering dextrose concentrations diluted in distilled water scaling in a range from 30mg/dl to 45mg/dl. For comparison purposes, we employed the method of rotating an analyzer and compare the optical activity variation for both methods.

Paper Details

Date Published: 6 September 2019
PDF: 7 pages
Proc. SPIE 11132, Polarization Science and Remote Sensing IX, 1113213 (6 September 2019); doi: 10.1117/12.2529659
Show Author Affiliations
Humberto Macias-Mendoza, Univ. of Guadalajara (Mexico)
David I. Serrano-García, Univ. of Guadalajara (Mexico)
Jorge L. Flores, Univ. of Guadalajara (Mexico)
Guillermo García Torales, Univ. of Guadalajara (Mexico)
Azael Mora-Núñez, Univ. of Guadalajara (Mexico)
Héctor Santiago Hernández, Univ. of Guadalajara (Mexico)
Geliztle A. Parra Escamilla, Univ. of Guadalajara (Mexico)
Francisco J. Cervantes Lozano, Univ. of Guadalajara (Mexico)

Published in SPIE Proceedings Vol. 11132:
Polarization Science and Remote Sensing IX
Julia M. Craven; Joseph A. Shaw; Frans Snik, Editor(s)

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