Share Email Print
cover

Proceedings Paper • new

Measuring bidirectional reflectance distribution of low reflectivity surfaces in the near infrared
Author(s): Luan C. Doan; J. Robert Mahan; Kory J. Priestley; Nguyen Q. Vinh
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Knowledge of bidirectional reflectance angular distribution of low reflectivity surfaces is important for predicting stray light in optical systems. We have performed bidirectional reflectance distribution measurements at wavelengths of 633 nm and 850 nm for surfaces coated with Z302, a commercial optical coating material widely used in optical instruments. The bidirectional reflectance properties of these surfaces depend on surface topology characterized by thickness and roughness parameters. To explain our results, we have employed directional scatter analysis of the experimental data that can be represented by a linear combination of diffuse, glossy, and specular, components. Modeling the bidirectional reflectance distribution in the context of a ray-trace can provide important information of stray light, coated surfaces, and their impact on performance of optical instruments.

Paper Details

Date Published: 11 September 2019
PDF: 7 pages
Proc. SPIE 11103, Optical Modeling and System Alignment, 111030I (11 September 2019); doi: 10.1117/12.2529629
Show Author Affiliations
Luan C. Doan, Virginia Polytechnic Institute and State Univ. (United States)
J. Robert Mahan, Virginia Polytechnic Institute and State Univ. (United States)
Kory J. Priestley, NASA Langley Research Ctr. (United States)
Nguyen Q. Vinh, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 11103:
Optical Modeling and System Alignment
Mark A. Kahan; José Sasián; Richard N. Youngworth, Editor(s)

© SPIE. Terms of Use
Back to Top