Share Email Print
cover

Proceedings Paper

Deep UV resonance Raman spectroscopy for standoff explosive detection (Conference Presentation)
Author(s): Sergei V. Bykov; Kyle T. Hufziger; Ryan D. Roppel; Dipak Rout; Ivan G. Pallares; Ryan S. Jakubek; Sanford A. Asher

Paper Abstract

Due to its high sensitivity and selectivity, UV resonance Raman (UVRR) spectroscopy has a number of scientific and industrial applications. Deep UVRR excited within explosive absorption bands (200 – 230 nm) enables trace explosive detection at a distance due to the resonance enhancement of Raman band intensities, stronger light scattering at short wavelengths, as well as negligible florescence interference. We are developing deep UVRR detection methodologies by investigating resonance enhancement of explosives excited in the deep UV, determining the optimal excitation wavelengths, investigating explosive UV-photochemistry, characterizing explosive UV photoproducts, and measuring UVRR spectral evolution during explosive photolysis. We are also developing state-of-the-art UVRR instrumentation by designing and manufacturing high efficiency, high throughput standoff UVRR spectrometers, co-developing new compact solid state deep UV lasers, and designing novel deep UV optical diffracting devices.

Paper Details

Date Published: 9 September 2019
PDF
Proc. SPIE 11086, UV and Higher Energy Photonics: From Materials to Applications 2019, 1108602 (9 September 2019);
Show Author Affiliations
Sergei V. Bykov, Univ. of Pittsburgh (United States)
Kyle T. Hufziger, Univ. of Pittsburgh (United States)
Ryan D. Roppel, Univ. of Pittsburgh (United States)
Dipak Rout, Univ. of Pittsburgh (United States)
Ivan G. Pallares, Univ. of Pittsburgh (United States)
Ryan S. Jakubek, Univ. of Pittsburgh (United States)
Sanford A. Asher, Univ. of Pittsburgh (United States)


Published in SPIE Proceedings Vol. 11086:
UV and Higher Energy Photonics: From Materials to Applications 2019
Gilles Lérondel; Yong-Hoon Cho; Atsushi Taguchi; Satoshi Kawata, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray