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Proceedings Paper

Point spread function measurement for projector based on Fourier single-pixel imaging
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Paper Abstract

Point spread function (PSF) of projector plays an important role in coaxial projection-imaging profilometry and binary defocusing fringe projection profilometry. In the proposed method, the SPI (Single Pixel Imaging)-based PSF measurement method has been used to obtain the PSF of the projector point by point. We use the camera to capture the SPI patterns projected by the projector on a white plane. By considering each pixel of the camera as a single-pixel detector, we can apply SPI technology to the camera pixels and acquire the light transport coefficients between the object points on the white plane and image points of projector, which is the spatially varying blur. Owing to the characteristic of SPI, the proposed method could obtain the spatially varying blur of every pixel directly. The experiment also verified that the proposed method could provide a more accurate blur kernel than the traditional Gaussian blur kernel to fit the blur model of the camera lens.

Paper Details

Date Published: 11 September 2019
PDF: 6 pages
Proc. SPIE 11102, Applied Optical Metrology III, 111020T (11 September 2019); doi: 10.1117/12.2529200
Show Author Affiliations
Ruotong Wu, Beihang Univ. Qingdao Research Institute (China)
Hongzhi Jiang, Beihang Univ. (China)
Beihang Univ. Qingdao Research Institute (China)
Huijie Zhao, Beihang Univ. (China)
Beihang Univ. Qingdao Research Institute (China)
Xudong Li, Beihang Univ. (China)
Beihang Univ. Qingdao Research Institute (China)
Qi Guo, Beihang Univ. (China)
Beihang Univ. Qingdao Research Institute (China)

Published in SPIE Proceedings Vol. 11102:
Applied Optical Metrology III
Erik Novak; James D. Trolinger, Editor(s)

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