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Proceedings Paper

Measurement of Van der Waals force using optical tweezers
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Paper Abstract

Surface effects are crucial in several mesoscopic phenomena, especially those concerning biological entities. Here we determine the effects of Van der Waals forces at relatively long range ( 80 nm) by optically trapping a probe particle close to a large silica particle and modulating the spatial position of the probe employing oscillating optical tweezers. This method has greater signal-to-noise in the experimentally measured probe-response as compare to that obtained from measurements of Brownian fluctuations. We quantify the H-value experimentally by analyzing the amplitude response of a single trapped particle in comparison to numerically expected results by employing chi-square fitting, and obtain good agreement with the known H-value for the system.

Paper Details

Date Published: 9 September 2019
PDF: 5 pages
Proc. SPIE 11083, Optical Trapping and Optical Micromanipulation XVI, 110832G (9 September 2019);
Show Author Affiliations
Avijit Kundu, Indian Institute of Science Education and Research Kolkata (India)
Shuvojit Paul, Indian Institute of Science Education and Research Kolkata (India)
Soumitro Banerjee, Indian Institute of Science Education and Research Kolkata (India)
Ayan Banerjee, Indian Institute of Science Education and Research Kolkata (India)


Published in SPIE Proceedings Vol. 11083:
Optical Trapping and Optical Micromanipulation XVI
Kishan Dholakia; Gabriel C. Spalding, Editor(s)

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