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The new x-ray laboratory: enabling access to structure, composition, and morphology through laboratory x-ray instrumentation (Conference Presentation)
Author(s): Jeff Gelb; David Vine; Ruimin Qiao; Xiaolin Yang; Srivatsan Seshadri; Benjamin Stripe; Sylvia Lewis; S. H. Lau; Wenbing Yun

Paper Abstract

The past decade has witnessed tremendous growth in both interest and available techniques for laboratory X-ray analysis. From the progression of commercially-available micro- and nano-CT scanners to the resolution and sensitivity enhancements of x-ray fluorescence spectrometers, the scientific community is benefiting from a rapid expansion of laboratory-based x-ray techniques. In our work, we have developed a suite of advanced x-ray instrumentation providing a wide range of enhanced capabilities for specimen characterization. The key enabling technology lies in the X-ray source, which features a microstructured target capable of providing 5-10x higher brightness than conventional sealed-tube x-ray sources and offering power flux densities that rival rotating anode sources. The target array can be custom-designed to incorporate a variety of materials, facilitating fast & easy switching between characteristic emission lines and radiation spectra. This source has been subsequently integrated with state-of-the-art X-ray focusing optics, such as ellipsoidal/paraboloidal capillary lenses and finely-structured Fresnel zone plate imaging objective lenses, and sensitive scintillator-coupled CCD detection systems, opening up new opportunities for advancing laboratory x-ray inspection equipment. Here, we will describe the system geometries in detail and demonstrate how these new advancements have led us to the development of laboratory micro-XRF, nano-XRM, and XAS instrumentation. We will also briefly introduce the image-centric software workspace, which facilitates novice users to collect data quickly and reliably with minimal training overhead.

Paper Details

Date Published: 17 September 2019
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Proc. SPIE 11113, Developments in X-Ray Tomography XII, 111130E (17 September 2019); doi: 10.1117/12.2528840
Show Author Affiliations
Jeff Gelb, Sigray, Inc. (United States)
David Vine, Sigray, Inc. (United States)
Ruimin Qiao, Sigray, Inc. (United States)
Xiaolin Yang, Sigray, Inc. (United States)
Srivatsan Seshadri, Sigray, Inc. (United States)
Benjamin Stripe, Sigray, Inc. (United States)
Sylvia Lewis, Sigray, Inc. (United States)
S. H. Lau, Sigray, Inc. (United States)
Wenbing Yun, Sigray, Inc. (United States)


Published in SPIE Proceedings Vol. 11113:
Developments in X-Ray Tomography XII
Bert Müller; Ge Wang, Editor(s)

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