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Proceedings Paper

Performance and time stability of Ir/SiC X-ray mirror coatings for ATHENA
Author(s): S. Svendsen; S. Massahi; D. D. M. Ferreira; F. E. Christensen; A. Jafari; P. L. Henriksen; M. Collon; B. Landgraf; D. Girou; M. Krumrey; L. Cibik; A. Schubert; E. Handick; B. Shortt
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Paper Abstract

Excellent X-ray reflective mirror coatings are key in order to meet the performance requirements of the ATHENA telescope. The baseline coating design of ATHENA was initially formed by Ir/B4C but extensive studies have identified critical issues with the stability of the B4C top layer which shows strong evolution over time and appears incompatible with the industrialization processes required for the production of mirror modules. Motivated by the need for a compatible top layer material to improve the telescope performance at low energies and based on simulated performance, a SiC top layer has been selected as the best substitute to B4C. We report the latest development of Ir/SiC bilayer coatings optimized for ATHENA and the characterization of coating performance and stability.

Paper Details

Date Published: 9 September 2019
PDF: 10 pages
Proc. SPIE 11119, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, 111190G (9 September 2019); doi: 10.1117/12.2528664
Show Author Affiliations
S. Svendsen, DTU Space (Denmark)
S. Massahi, DTU Space (Denmark)
D. D. M. Ferreira, DTU Space (Denmark)
F. E. Christensen, DTU Space (Denmark)
A. Jafari, DTU Space (Denmark)
P. L. Henriksen, DTU Space (Denmark)
M. Collon, cosine B.V. (Netherlands)
B. Landgraf, cosine B.V. (Netherlands)
D. Girou, cosine B.V. (Netherlands)
M. Krumrey, Physikalisch-Technische Bundesanstalt (Germany)
L. Cibik, Physikalisch-Technische Bundesanstalt (Germany)
A. Schubert, Physikalisch-Technische Bundesanstalt (Germany)
E. Handick, Physikalisch-Technische Bundesanstalt (Germany)
B. Shortt, European Space Research and Technology Ctr. (Netherlands)

Published in SPIE Proceedings Vol. 11119:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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