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Measurement of scattered light polarization on surfaces using focused illumination
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Paper Abstract

We present a method to measure the polarization of light scattered on structured surfaces, through the implementation of a Mueller-matrix polarimeter, using focused illumination. Typically the scattered light has been measured using an incident beam with a diameter on the order of a few cm for surfaces with scales of the order of microns, mainly to avoid problems with the speckle pattern of light, however in this way it is not possible to obtain information on local variations in the polarization effects presented on the surface. Therefore, we use an incident spot size of a few microns to illuminate and analyze the local variations in the polarization state produced by the sample. First, we will begin by describing the instrumentation of the polarimeter, which uses Liquid Crystal Variable Retarders (LCVRs) to control the incident and detected polarization states. Our device implements a calibration and data extraction method, which allows us to reduce the experimental error in the instrument to obtain efficient measurements. We use as a sample, a reflective structured surface with dimensions of 15 microns and we use an incident beam size of 5 microns to perform a preliminary qualitative interpretation and comparison of results of experimental cases with results of numerical calculation based on the Kirchhoff approximation of light scattering, including polarization effects, the simulations has been previously verified with other methods. We conclude about the advantages of measuring the polarization effect in the scattering pattern from one point to another in the studied sample.

Paper Details

Date Published: 6 September 2019
PDF: 12 pages
Proc. SPIE 11132, Polarization Science and Remote Sensing IX, 111320J (6 September 2019); doi: 10.1117/12.2528562
Show Author Affiliations
O. Rodríguez-Núñez, Univ. Nacional Autónoma de México (Mexico)
Iván Montes-González, Univ. Nacional Autónoma de México (Mexico)
Neil C. Bruce, Univ. Nacional Autónoma de México (Mexico)


Published in SPIE Proceedings Vol. 11132:
Polarization Science and Remote Sensing IX
Julia M. Craven; Joseph A. Shaw; Frans Snik, Editor(s)

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