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Proceedings Paper

Modeling spectral degradation of MODIS and VIIRS solar diffusers
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Paper Abstract

Solar diffusers (SDs) onboard the Moderate Resolution Imaging Spectroradiometer (MODIS) on Terra and Aqua spacecraft and the Visible Infrared Imaging Radiometer Suite (VIIRS) on SNPP and NOAA-20 spacecraft have been used as the primary onboard radiometric calibrator for reflective solar bands and their spectral reflectance is known to degrade on-orbit. All of the solar diffusers on these instrument show faster degradation of reflectance in the 0.4 to 0.6 µm channels than the longer wavelength channels. The spectral degradation of these SDs is due to the surface roughness growth under the exposure to solar UV and energetic particle radiation in space. In this paper, the origin of SD degradation is modeled by the physics-based Surface Roughness-induced Rayleigh Scattering (SRRS) model. The longterm growths of surface roughness of the SD on these instruments are characterized to show the consistency of SD roughness growth rates between Terra/Aqua MODIS and SNPP/NOAA-20 VIIRS. There was coincidental flattening or reverse in the growth trend of the surface roughness for the Terra/Aqua MODIS and SNPP VIIRS SDs, which can be due to the space weather variation. The applicability of the SRRS model is demonstrated with the long term spectral reflectance data from independent spaceborne SDs.

Paper Details

Date Published: 9 September 2019
PDF: 10 pages
Proc. SPIE 11127, Earth Observing Systems XXIV, 111271S (9 September 2019);
Show Author Affiliations
Xi Shao, Univ. of Maryland, College Park (United States)
Tung-Chang Liu, Univ. of Maryland, College Park (United States)
Xiaoxiong Xiong, NASA Goddard Space Flight Ctr. (United States)
Changyong Cao, NOAA National Environmental Satellite, Data, and Information Service (United States)
Taeyoung Choi, Global Science & Technology, Inc. (United States)
Amit Angal, Science Systems and Applications, Inc. (United States)


Published in SPIE Proceedings Vol. 11127:
Earth Observing Systems XXIV
James J. Butler; Xiaoxiong (Jack) Xiong; Xingfa Gu, Editor(s)

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