Share Email Print
cover

Proceedings Paper • new

One-dimensional local binary pattern based color descriptor to classify stress values from photoelasticity videos
Author(s): Juan C. Briñez de León; Domingo Mery; Alejandro Restrepo M.; John W. Branch
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Evaluating the stress distribution in structures under temporal loads is being carry out by many of the engineering applications such as: impacts, cracks, bending, thermal-transient and other. In those cases, conventional photoelasticity techniques are more complex to evaluate the stress field because of their complicated and expensive experiments, quantity of computational procedures, and their time by time analysis. However, dynamic photoelasticity experiments produce temporal information, such as color variations, which could be analyzed, described, and classified in order to perform a whole stress field evaluation. In this paper, the one-dimensional local binary patterns (1D-LBP) are used to describe such color variations and use them to identify the stress values they belong. For different experimental configurations, this proposal achieved an accuracy of 98% when evaluating the stress field of cases with similar light sources than with a reference experiment, and 92% for experiments with other light conditions. These results make this descriptor able to determine categorical stress maps from a photoelasticity video itself, which significantly opens new opportunities to simplify the experimental and computational operations that limit the stress evaluation process in line with the dynamic experiment.

Paper Details

Date Published: 6 September 2019
PDF: 10 pages
Proc. SPIE 11136, Optics and Photonics for Information Processing XIII, 1113607 (6 September 2019); doi: 10.1117/12.2528418
Show Author Affiliations
Juan C. Briñez de León, Institución Univ. Pascual Bravo (Colombia)
Univ. Nacional de Colombia Sede Medellín (Colombia)
Domingo Mery, Pontificia Univ. Católica de Chile (Chile)
Alejandro Restrepo M., Univ. Nacional de Colombia Sede Medellín (Colombia)
John W. Branch, Institución Univ. Pascual Bravo (Colombia)


Published in SPIE Proceedings Vol. 11136:
Optics and Photonics for Information Processing XIII
Khan M. Iftekharuddin; Abdul A. S. Awwal; Victor H. Diaz-Ramirez; Andrés Márquez, Editor(s)

© SPIE. Terms of Use
Back to Top