
Proceedings Paper
Static Fourier transform mid-infrared spectrometer with continuous background correctionFormat | Member Price | Non-Member Price |
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Paper Abstract
In this contribution we present a broadband static Fourier transform spectrometer (bsFTS) based on a single- mirror interferometer containing only off-the-shelf optical components and an uncooled microbolometer detector
array. The system uses concave mirrors instead of lenses and therefore covers a wide spectral range from 3.6 μm to 17 μm at a spectral resolution of 12 cm-1. Furthermore, dispersion effects can be minimized and the system can thus be designed with increased temperature stability. We demonstrate the optical and mechanical design of
the current laboratory prototype and compare the instrument to a scanning Fourier transform infrared (FTIR) spectrometer. Additionally, we present a technique for simultaneously acquiring the sample spectrum and the background spectrum. Thereby, a variation of the background over time can be compensated continuously and hence the bsFTS presented in this contribution offers significant potential with regard to long-term stability.
Paper Details
Date Published: 3 September 2019
PDF: 7 pages
Proc. SPIE 11102, Applied Optical Metrology III, 1110218 (3 September 2019); doi: 10.1117/12.2528404
Published in SPIE Proceedings Vol. 11102:
Applied Optical Metrology III
Erik Novak; James D. Trolinger, Editor(s)
PDF: 7 pages
Proc. SPIE 11102, Applied Optical Metrology III, 1110218 (3 September 2019); doi: 10.1117/12.2528404
Show Author Affiliations
Michael H. Köhler, Technische Univ. München (Germany)
Michael Schardt, Technische Univ. München (Germany)
Hamza B. Ghazala, Technische Univ. München (Germany)
Ennio Colicchia, Technische Univ. München (Germany)
Michael Schardt, Technische Univ. München (Germany)
Hamza B. Ghazala, Technische Univ. München (Germany)
Ennio Colicchia, Technische Univ. München (Germany)
Patrick Kienle, Technische Univ. München (Germany)
Xingchen Dong, Technische Univ. München (Germany)
Kun Wang, Technische Univ. München (Germany)
Alexander W. Koch, Technische Univ. München (Germany)
Xingchen Dong, Technische Univ. München (Germany)
Kun Wang, Technische Univ. München (Germany)
Alexander W. Koch, Technische Univ. München (Germany)
Published in SPIE Proceedings Vol. 11102:
Applied Optical Metrology III
Erik Novak; James D. Trolinger, Editor(s)
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