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Proceedings Paper

Evaluation of the spatial frequency response and the uncertainty for a commercial structured light system
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Paper Abstract

Structured light systems (SLS) have become increasingly important for three-dimensional shape measurements. A quantitative evaluation of the spatial resolution is also becoming increasingly important. The spatial frequency response of the instrument is a reasonable metric for resolution and is commonly referred to as the instrument transfer function (ITF). In this paper, we present a methodology to estimate the ITF of a commercial SLS (the EinScan-Pro 3D Scanner) and its uncertainty. A measurement of a step artifact is used for the ITF estimation. We also discuss a method to check the validity of the artifact used for the measurement. The ITF dependence on step orientation and position in the measurement volume is also presented, in addition to a comparison between ITF and the modulation transfer function (MTF) for the cameras in the instrument.

Paper Details

Date Published: 3 September 2019
PDF: 12 pages
Proc. SPIE 11102, Applied Optical Metrology III, 111020X (3 September 2019);
Show Author Affiliations
Swati Jain, The Univ. of North Carolina at Charlotte (United States)
Angela Davies Allen, The Univ. of North Carolina at Charlotte (United States)
Bin Zhang, Corning Incorporated (United States)


Published in SPIE Proceedings Vol. 11102:
Applied Optical Metrology III
Erik Novak; James D. Trolinger, Editor(s)

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