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Proceedings Paper

Microstructural characterization and phase transitions in polycrystalline and nanocrystalline doped zirconia for incorporation in medical prosthesis
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Paper Abstract

Zirconium oxide doped with rare earth elements (Y, Ce, etc.) is an important candidate material for incorporation in medical implants and prosthetics. Due to their mechanical properties, the doped compounds hold a unique place among the oxide ceramics since they can undergo phase transformations allowing a toughening mechanism. We aim to determine the influence of different types of thermal treatments for Zr1-xCexO2 (x=0.1; 0.15; 0.20) as well as the structural and mechanical properties of these materials using X-ray and Neutron Diffraction (ND) as well as high resolution of SEM imaging combined with Electron Backscattered Diffraction (EBSD). Our analyses have shown that, following the doping mechanism, the samples exhibit stable crystallographic structures but also improved material strengths, which can make these compounds suitable for a wide range of promising clinical applications.

Paper Details

Date Published: 9 September 2019
PDF: 9 pages
Proc. SPIE 11085, Low-Dimensional Materials and Devices 2019, 1108512 (9 September 2019); doi: 10.1117/12.2528037
Show Author Affiliations
Alina Bruma, National Institute of Standards and Technology (United States)
Adriana Savin, National Institute of Research & Development for Technical Physics (Romania)
Mihai-Liviu Craus, National Institute of Research & Development for Technical Physics (Romania)
Joint Institute for Nuclear Research (Russian Federation)
Vitalii Turchenko, Joint Institute for Nuclear Research (Russian Federation)
Oleksandr S. Doroshkevych, Joint Institute for Nuclear Research (Russian Federation)
Frantisek Novy, Univ. of Žilina (Slovakia)
Tatiana E. Konstantinova, Donetsk Institute for Physics and Engineering named after O.O. Galkin (Ukraine)

Published in SPIE Proceedings Vol. 11085:
Low-Dimensional Materials and Devices 2019
Nobuhiko P. Kobayashi; A. Alec Talin; Albert V. Davydov, Editor(s)

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