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Design optimization of a confocal x-ray fluorescence imaging capability for XFM and SRX at NSLS-II
Author(s): Yuan Gao; Andrew Kiss; Ryan Tappero; Benjamin Stripe; Wenbing Yun; Yong S. Chu
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Paper Abstract

We propose a novel confocal x-ray fluorescence (XRF) imaging capability at the X-ray Fluorescence Microprobe (XFM) and Submicron Resolution X-ray Spectroscopy (SRX) beamlines of the National Synchrotron Light Source II (NSLS-II). Comparing to the conventional XRF tomography, this method can image a local region of interest within tens of minutes instead of hours. We will also present the optimized design of the confocal optic and estimated imaging resolution and throughput, based on the real parameters of the beamline photon delivery systems and the proposed confocal setup.

Paper Details

Date Published: 9 September 2019
PDF: 7 pages
Proc. SPIE 11112, X-Ray Nanoimaging: Instruments and Methods IV, 1111204 (9 September 2019); doi: 10.1117/12.2528026
Show Author Affiliations
Yuan Gao, Brookhaven National Lab. (United States)
Andrew Kiss, Brookhaven National Lab (United States)
Ryan Tappero, Brookhaven National Lab. (United States)
Benjamin Stripe, Sigray Inc. (United States)
Wenbing Yun, Sigray Inc. (United States)
Yong S. Chu, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 11112:
X-Ray Nanoimaging: Instruments and Methods IV
Barry Lai; Andrea Somogyi, Editor(s)

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