Share Email Print
cover

Proceedings Paper • new

Temperature dependence of the drying process in polymer solutions observed by dynamic speckle detection
Author(s): E. Stoykova; B. Blagoeva; L. Nedelchev; D. Nazarova
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Dynamic speckle metrology is a means for evaluating the speed of various processes in industrial or biological samples. The method indicates regions of lower or higher activity on the sample surface through statistical processing of speckle patterns formed on this surface under laser illumination. In this paper, we applied the method to study the influence of the substrate temperature on the drying process in azopolymer solutions leading to formation of thin photo birefringent polymer films. This would give the optimal temperature for obtaining smooth and uniform thin films for the shortest possible time. We recorded several sets of correlated in time speckle patterns of a transparent drop of azopolymer solution in two different solvents (water and methanol) on a glass plate illuminated by laser light. The temperature of the plate and respectively of the polymer solution was controlled by high-precision thermal stage. We built two-dimensional maps of activity at different moments and estimated the speed of drying of the polymer solution depending of the substrate temperature. This data were further correlated with the optical quality of the dry polymer thin films.

Paper Details

Date Published: 3 October 2019
PDF: 6 pages
Proc. SPIE 11207, Fourth International Conference on Applications of Optics and Photonics, 112071S (3 October 2019); doi: 10.1117/12.2527432
Show Author Affiliations
E. Stoykova, Institute of Optical Materials and Technologies (Bulgaria)
B. Blagoeva, Institute of Optical Materials and Technologies (Bulgaria)
L. Nedelchev, Institute of Optical Materials and Technologies (Bulgaria)
D. Nazarova, Institute of Optical Materials and Technologies (Bulgaria)


Published in SPIE Proceedings Vol. 11207:
Fourth International Conference on Applications of Optics and Photonics
Manuel Filipe P. C. M. Martins Costa, Editor(s)

© SPIE. Terms of Use
Back to Top