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Quantitative imaging of advanced nanostructured materials with scattering-type scanning near field optical microscopy
Author(s): Stefan G. Stanciu; Denis E. Tranca; Laura Pastorino; Stefania Boi; Young Min Song; Young Jin Yoo; Satoshi Ishii; Fang Yang; Aiguo Wu; Radu Hristu; George A. Stanciu
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Paper Abstract

Scattering-type Scanning Near Field Optical Microscopy (s-SNOM) has been demonstrated as a valuable tool for revealing important properties of materials at nanoscale. Recent proof-of-concept experiments have shown that, among others, s-SNOM can provide quantitative information on the real and imaginary parts of the dielectric function, and hence of intrinsic optical properties of materials and biological samples. In this work we further explored these capabilities in several experiments dealing with microcapsules for drug delivery, ultra-thin optical coatings with tunable color properties, and two types of nanoparticles with important applications in energy storage and conversion, or biosensing and theranostics.

Paper Details

Date Published: 3 October 2019
PDF: 6 pages
Proc. SPIE 11207, Fourth International Conference on Applications of Optics and Photonics, 112071K (3 October 2019); doi: 10.1117/12.2527401
Show Author Affiliations
Stefan G. Stanciu, Politehnica Univ. of Bucharest (Romania)
Denis E. Tranca, Politehnica Univ. of Bucharest (Romania)
Laura Pastorino, Univ. of Genoa (Italy)
Stefania Boi, Univ. of Genoa (Italy)
Young Min Song, Gwangju Institute of Science and Technology (Korea, Republic of)
Young Jin Yoo, Gwangju Institute of Science and Technology (Korea, Republic of)
Satoshi Ishii, National Institute for Materials Science (Japan)
Fang Yang, Ningbo Institute of Materials Technology and Engineering (China)
Aiguo Wu, Ningbo Institute of Materials Technology and Engineering (China)
Radu Hristu, Politehnica Univ. of Bucharest (Romania)
George A. Stanciu, Politehnica Univ. of Bucharest (Romania)


Published in SPIE Proceedings Vol. 11207:
Fourth International Conference on Applications of Optics and Photonics
Manuel Filipe P. C. M. Martins Costa, Editor(s)

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