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Proceedings Paper • Open Access

A compact light source providing high-flux, quasi-monochromatic, tunable X-rays in the laboratory
Author(s): Benjamin Hornberger; Jack Kasahara; Martin Gifford; Ronald Ruth; Rod Loewen

Paper Abstract

There is a large performance gap between conventional, electron-impact X-ray sources and synchrotron radiation sources. Electron-impact X-ray sources are compact, low to moderate cost, widely available and can have high total flux, but have limited tunability (broad spectrum bremsstrahlung plus fixed characteristic lines) and low brightness. By contrast, synchrotron radiation sources provide extremely high brightness (coherent flux), are tunable and can be monochromatized to a very high degree. However, they are very large and expensive, and typically operated as national user facilities with limited access. An Inverse Compton Scattering (ICS) X-ray source can bridge this gap by providing a narrow-band, high flux and tunable X-ray source that fits into a laboratory at a cost of a few percent of a large synchrotron facility. It works by colliding a high-power laser beam with a relativistic electron beam, in which case the backscattered photons have an energy in the X-ray regime. This paper will describe the working principle of the Lyncean Compact Light Source, a storage-ring based ICS source, its unique beam properties and recent developments that are expected to increase flux and brightness by an order of magnitude compared to earlier versions. Furthermore, it will illustrate how such an X-ray source can be the cornerstone of a local X-ray facility serving applications from diffraction and imaging to scattering and spectroscopy. An overview of demonstrated and potential applications will be provided.

Paper Details

Date Published: 9 September 2019
PDF: 13 pages
Proc. SPIE 11110, Advances in Laboratory-based X-Ray Sources, Optics, and Applications VII, 1111003 (9 September 2019);
Show Author Affiliations
Benjamin Hornberger, Lyncean Technologies, Inc. (United States)
Jack Kasahara, Lyncean Technologies, Inc. (United States)
Martin Gifford, Lyncean Technologies, Inc. (United States)
Ronald Ruth, Lyncean Technologies, Inc. (United States)
Rod Loewen, Lyncean Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 11110:
Advances in Laboratory-based X-Ray Sources, Optics, and Applications VII
Alex Murokh; Daniele Spiga, Editor(s)

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