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Proceedings Paper

Assessment of occlusal enamel alterations utilizing depolarization imaging based on PS-OCT
Author(s): Jonas Golde; Florian Tetschke; Robin Vosahlo; Julia Walther; Christian Hannig; Edmund Koch; Lars Kirsten
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Paper Abstract

While dental caries represents the major chronic disease of humans, visual and tactile inspection are the methods of choice in daily dental practice. Several optical technologies have been developed in recent years for the purpose of dental examination, including near-infrared light transillumination as a promising tool for the supplementation and partial replacement of radiography. In case of occlusal alterations, the incidence of surface discolorations impedes the visual assessment, whereas tactile inspection appears to yield little diagnostic information or might be detrimental. Optical coherence tomography (OCT) facilitates depth-resolved imaging with μm resolution, utilizing near-infrared light, and has already shown its potential for various dental applications. We have recently demonstrated that depolarization imaging utilizing the degree of polarization uniformity (DOPU) extends those abilities by the detection of early carious lesions, as it provides an unambiguous demineralization contrast. Here, we show that this approach also enables the assessment of occlusal enamel lesions in the presence of stains, and compare PS-OCT cross sections with polarized light microscopy (PLM) images of thin sections. For tooth samples with discoloration or demineralization, respectively, PS-OCT and PLM results are in good agreement.

Paper Details

Date Published: 19 July 2019
PDF: 4 pages
Proc. SPIE 11078, Optical Coherence Imaging Techniques and Imaging in Scattering Media III, 110780P (19 July 2019); doi: 10.1117/12.2527228
Show Author Affiliations
Jonas Golde, Universitätsklinikum Carl Gustav Carus Dresden (Germany)
Florian Tetschke, Technische Univ. of Denmark (Germany)
Robin Vosahlo, Technische Univ. of Denmark (Germany)
Julia Walther, Technische Univ. of Denmark (Germany)
Christian Hannig, Technische Univ. of Denmark (Germany)
Edmund Koch, Technische Univ. of Denmark (Germany)
Lars Kirsten, Technische Univ. of Denmark (Germany)

Published in SPIE Proceedings Vol. 11078:
Optical Coherence Imaging Techniques and Imaging in Scattering Media III
Maciej Wojtkowski; Stephen A. Boppart; Wang-Yuhl Oh, Editor(s)

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