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Proceedings Paper

Light field three-dimensional measurement
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Paper Abstract

This letter reports a novel method for light field three-dimensional measurement by using unfocused plenoptic cameras. A light field metric model, based on which nonmetric depths in the image space can be mapped to metric dimensions in the object space, was established. Furthermore, with the aid of a three-dimensional measurement system, light field metric calibration was carried out by determining light rays with spatio-angular parameters and set up the depth relationship between the object and image spaces in accordance with the light field image properties.

Paper Details

Date Published: 21 June 2019
PDF: 7 pages
Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 1105628 (21 June 2019);
Show Author Affiliations
Zewei Cai, Shenzhen Univ. (China)
Xiaoli Liu, Shenzhen Univ. (China)
Meihua Liao, Shenzhen Univ. (China)
Wenqi He, Shenzhen Univ. (China)
Giancarlo Pedrini, Univ. Stuttgart (Germany)
Wolfgang Osten, Univ. Stuttgart (Germany)
Xiang Peng, Shenzhen Univ. (China)


Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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