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Proceedings Paper

Prism alignment using a point source microscope
Author(s): Robert E. Parks
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Paper Abstract

The Point Source Microscope (PSM) is used to locate the apex of retroreflecting prisms in 3 degrees of translational freedom with a precision of less than 1 micron. The process is easily explained for right angle prisms, as will be done in this paper, but the explanation is valid for cube corner retroreflectors such as those mounted in spherical balls, spherically mounted retroreflectors, or SMRs, for use with laser trackers. With suitable, simple fixturing, the measurements for all 3 directions are made to a precision of < 1 μm in less than 1 minute.

Paper Details

Date Published: 30 August 2019
PDF: 11 pages
Proc. SPIE 11103, Optical Modeling and System Alignment, 1110303 (30 August 2019); doi: 10.1117/12.2526534
Show Author Affiliations
Robert E. Parks, Optical Perspectives Group, LLC (United States)

Published in SPIE Proceedings Vol. 11103:
Optical Modeling and System Alignment
Mark A. Kahan; José Sasián; Richard N. Youngworth, Editor(s)

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