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Proceedings Paper

Investigation of the dynamic fragmentation process in ceramics by using ultra-high speed x-ray imaging with synchrotron radiation
Author(s): P. Forquin; B. Lukic; Y. Duplan; D. Saletti; D. Eakins; A. Rack
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Paper Abstract

For several decades, ceramic materials have been widely used in bilayered protective configurations. However, the impact loading produces dynamic tensile stresses that spread out the ceramic tile leading to an intense fragmentation made of short oriented cracks. To improve the design of such configurations the fragmentation process needs to be better understood. The edge-on impact (EOI) testing method constitutes one of the most used experimental techniques to investigate the fragmentation process in brittle materials at high-strain-rates. A cylindrical projectile hits the edge of a target leading to a multiple fragmentation. In classical EOI experiments, an ultra-high-speed camera is used to visualize the fragmentation process on the lateral surface. However, the fragmentation pattern in the bulk of the target can only be analysed post-mortem. In the present work, in addition to this classical optical inspection method, EOI experiments have been conducted in the European Synchrotron Radiation Facility with the means of ultra-high-speed imaging, i. e., X-ray radioscopy using the 16-bunch operation mode. The target, 60 x 30 x 6 mm3, was placed in the intense X-ray beam (beam energy about 30 keV) providing an observation field of 12.8 mm in width and 8 mm in height, and impacted with a projectile velocity of 144 m/s. A Shimadzu HPV-X2 camera lens-coupled to a fast scintillator was used to visualise the fragmentation process through the thickness with an interframe time set to 1065 ns. This fragmentation pattern is compared to pictures of the lateral surface obtained with an ultra-high-speed camera or post-mortem analysis.

Paper Details

Date Published: 28 January 2019
PDF: 6 pages
Proc. SPIE 11051, 32nd International Congress on High-Speed Imaging and Photonics, 110510Q (28 January 2019); doi: 10.1117/12.2526501
Show Author Affiliations
P. Forquin, Univ. Grenoble Alpes, CNRS (France)
B. Lukic, Univ. Grenoble Alpes, CNRS (France)
Y. Duplan, Univ. Grenoble Alpes, CNRS (France)
D. Saletti, Univ. Grenoble Alpes, CNRS (France)
D. Eakins, Univ. of Oxford (United Kingdom)
A. Rack, ESRF - The European Synchrotron (France)

Published in SPIE Proceedings Vol. 11051:
32nd International Congress on High-Speed Imaging and Photonics
Michel Versluis; Eleanor Stride, Editor(s)

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