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Proceedings Paper

Grazing incidence x-ray fluorescence based characterization of nanostructures for element sensitive profile reconstruction
Author(s): Anna Andrle; Philipp Hönicke; Philipp Schneider; Yves Kayser; Martin Hammerschmidt; Sven Burger; Frank Scholze; Burkhard Beckhoff; Victor Soltwisch
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Paper Abstract

For the reliable fabrication of the current and next generation of nanostructures it is essential to be able to determine their material composition and dimensional parameters. Using the grazing incidence X-ray fluoresence technique, which is taking advantage of the X-ray standing wave field effect, nanostructures can be investigated with a high sensitivity with respect to the structural and elemental composition. This is demonstrated using lamellar gratings made of Si3N4. Rigorous field simulations obtained from a Maxwell solver based on the finite element method allow to determine the spatial distribution of elemental species and the geometrical shape with sub-nm resolution. The increasing complexity of nanostructures and demanded sensitivity for small changes quickly turn the curse of dimensionality for numerical simulation into a problem which can no longer be solved rationally even with massive parallelisation. New optimization schemes, e.g. machine learning, are required to satisfy the metrological requirements. We present reconstruction results obtained with a Bayesian optimization approach to reduce the computational effort.

Paper Details

Date Published: 21 June 2019
PDF: 8 pages
Proc. SPIE 11057, Modeling Aspects in Optical Metrology VII, 110570M (21 June 2019); doi: 10.1117/12.2526082
Show Author Affiliations
Anna Andrle, Physikalisch-Technische Bundesanstalt (Germany)
Philipp Hönicke, Physikalisch-Technische Bundesanstalt (Germany)
Philipp Schneider, JCMwave GmbH (Germany)
Yves Kayser, Physikalisch-Technische Bundesanstalt (Germany)
Martin Hammerschmidt, JCMwave GmbH (Germany)
Sven Burger, JCMwave GmbH (Germany)
Konrad-Zuse-Zentrum für Informationstechnik Berlin (Germany)
Frank Scholze, Physikalisch-Technische Bundesanstalt (Germany)
Burkhard Beckhoff, Physikalisch-Technische Bundesanstalt (Germany)
Victor Soltwisch, Physikalisch-Technische Bundesanstalt (Germany)

Published in SPIE Proceedings Vol. 11057:
Modeling Aspects in Optical Metrology VII
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)

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