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Proceedings Paper

Adaptive windowed Fourier transform filtering method for speckle fringe patterns
Author(s): Jing Liu; Guoqing Zhou; Beibei Liu
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Paper Abstract

The heavy speckle noise in speckle fringe patterns makes it difficult to extract phase from those interferograms. Therefore filtering is essential and necessary. The windowed Fourier transform (WFT) is an effective method to fulfill this task. However, when the WFT is employed, several parameters, such as the window size, the threshold and the passband, need to be chosen carefully. In this paper, the filtering performance of WFT with different combination of those parameters is investigated by simulation firstly. Based on the comprehensive analysis, we then propose a fully adaptive windowed Fourier transform filtering method. In our method, the window size was determined with the help of wavelet transform, then the threshold was dynamically adjusted according to the amplitude of the window Fourier ridge. As a result, the optimum spectrum containing the fringe information could be obtained. At last, the filtered image can be obtained by inverse Fourier transform of such spectrum. The experimental results are presented to validate the method’s potential. The results were also compared with those obtained using contour window filtering and second-order directional partial differential equation filtering method. It can be seen that contour window filtering and second-order directional partial differential equation filtering could damage fringe structure because of deviation on fringe orientation calculation. While our proposed method can preserve the fringe structure as much as possible. As a result, our adaptive WFT method performs better than the other two methods. It provides an alternative way to suppress the speckle noise in the actual applications.

Paper Details

Date Published: 21 June 2019
PDF: 6 pages
Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 1105641 (21 June 2019); doi: 10.1117/12.2525906
Show Author Affiliations
Jing Liu, Northwestern Polytechnical Univ. (China)
Weinan Normal Univ. (China)
Guoqing Zhou, Northwestern Polytechnical Univ. (China)
Beibei Liu, Northwestern Polytechnical Univ. (China)

Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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