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Proceedings Paper

Full-field, high-frequency, heterodyne interferometry for dynamic metrology based on phase detection using a modified time-of-flight camera
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Paper Abstract

We describe a full field heterodyne interferometry system where the object beam is shifted by a high frequency with respect to the reference beam. The optical path difference between the object and reference beam is encoded in the phase of the envelope of the interference signal which is at the difference frequency. Conventionally, high frequency heterodyne interferometry is restricted to measurement of a single (or a few) point(s) as is the case in displacement measuring interferometers for precision machine tool axis feedback. This is because of the problem of demodulating the signal phase simultaneously for many pixels comprising a full-field image. This problem is overcome here by exploiting the capability of the special pixel structure employed in a Time of Flight (ToF) camera. This structure enables the measurement of the envelope phase of an optical signal at every pixel with respect to an electronic reference at the same frequency. ToF cameras are designed to measure the distance to an object in its field of view by detecting the phase delay, due to time of flight, of reflected light from a modulated source synchronized to the camera. In the described experimental interferometer, a Twyman-Green architecture is used with an acousto-optic modulator to produce interfering beams with a difference frequency of 20MHz. The image detector is a modified ToF camera based on a Texas Instruments OPT8241 sensor. The interferometer directly outputs a wrapped optical phase map with 12-bit resolution (equivalent OPD resolution 0.15 nm) at greater than 50 frames per second with no post-processing. The phase reconstruction is highly insensitive to the reference/object beam intensity ratio or to environmental noise.

Paper Details

Date Published: 21 June 2019
PDF: 15 pages
Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110560U (21 June 2019); doi: 10.1117/12.2525827
Show Author Affiliations
John B. Mitchell, Compass Optics Ltd. (United Kingdom)
Glyndŵr Innovations Ltd. (United Kingdom)
Gareth Wyn Roberts, Mathcyf Cyf Ltd. (United Kingdom)
Paul C. T. Rees, Wrexham Glyndŵr Univ. (United Kingdom)

Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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