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Proceedings Paper

An extrapolation-based method for improving the accuracy of phase retrieval with the transport of intensity equation
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Paper Abstract

Transport of Intensity Equation (TIE) is a simple and efficient method for phase retrieval by solving the equation between the intensity axial derivative and phase. In this method, the estimation of the axial derivative of intensity is very crucial. Simply, we use two defocused intensity images to estimate the axial derivative by finite difference method. However, the result is still unsatisfactory even though the optimal defocused distance is adopted. The reason lies in that the intensity’s axial change is not linear in the propagation of light. Simply using the finite difference between the two defocused images will ignore higher order axial derivatives. In other words, the estimation of the axial derivative of intensity will contain nonlinear errors. To solve this problem, we propose an extrapolation-based method to estimate the axial derivative of intensity using multiple intensity images. With Taylor expansion and a series of combination and eliminations on these images, high order terms of axial derivative errors are removed. As a result, the nonlinear errors in estimation of the axial derivative will be reduced. The performance of our proposed method for different types of phases under different illumination conditions is investigated. Compared with normal TIE, our method can obtain a much more accurate phase profile.

Paper Details

Date Published: 21 June 2019
PDF: 6 pages
Proc. SPIE 11062, Digital Optical Technologies 2019, 1106220 (21 June 2019); doi: 10.1117/12.2525786
Show Author Affiliations
Zixin Zhao, Xi'an Jiaotong Univ. (China)
Chen Fan, Xi'an Jiaotong Univ. (China)
Jinlei Zhao, No.203 Research Institute of China Ordnance Industries (China)
Yiying Zhuang, Xi'an Jiaotong Univ. (China)
Hangying Zhang, Xi'an Jiaotong Univ. (China)
Hong Zhao, Xi'an Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 11062:
Digital Optical Technologies 2019
Bernard C. Kress; Peter Schelkens, Editor(s)

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