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Proceedings Paper

Digital holographic microscopy for thickness characterization using synthetized partially coherent holograms
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Paper Abstract

In this work we propose a holographic approach for accurate characterization of thickness of transparent objects. The proposed method is based on recording a series of fully-coherent holograms, which are generated with varying tilt of object plane wave illumination. The captured holograms are numerically processed to obtain the corresponding complex fields, which are used to produce the longitudinal coherence function. This function allows to measure the absolute thickness of transparent parallel plates using highly monochromatic light source. The conclusions of this work are supported with results of numerical simulations.

Paper Details

Date Published: 21 June 2019
PDF: 8 pages
Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110563P (21 June 2019); doi: 10.1117/12.2525691
Show Author Affiliations
Marta Mikuła, Warsaw Univ. of Technology (Poland)
Juan Martinez-Carranza, Warsaw Univ. of Technology (Poland)
Tomasz Kozacki, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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