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Proceedings Paper

Automatic and accurate full-view registration method for 3D scanning system
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Paper Abstract

In a structured light-based 3D scanning system, the overall 3D information of to-be-measured objects cannot be retrieved at one time automatically. Currently the 3D registration algorithms can be divided into the auxiliary objects-based method and the feature points-based method. The former requires extra calibration objects or positioning platforms, which limits its application in free-form 3D scanning task. The latter can be conducted automatically, however, most of them tried to recover the motion matrix from extracted 2D features, which has been proved to be inaccurate. This paper proposed an automatic and accurate full-view registration method for 3D scanning system. Instead of using the 3D information of detected feature points to estimate the coarse motion matrix, 3D points reconstructed by the 3D scanning system were utilized. Firstly, robust SIFT features were extracted from each image and corresponding matching point pairs are achieved from two adjacent left images. Secondly, re-project all of the 3D point clouds onto the image plane of each left camera and corresponding 2D image points can be obtained. Filter out correct matching points from all 2D reprojection points under the guidance of the extracted SIFT matching points. Then, the covariance method was adopted to estimate the coarse registration matrix of adjacent positions. This procedure was repeated among every adjacent viewing position of the 3D scanning system. Lastly, fast ICP algorithm was performed to conduct fine registration of multi-view point clouds. Experiments conducted on real data have verified the effectiveness and accuracy of the proposed method.

Paper Details

Date Published: 21 June 2019
PDF: 9 pages
Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110563M (21 June 2019); doi: 10.1117/12.2525655
Show Author Affiliations
Pei Xu, Guilin Univ. of Electronic Technology (China)
Shenzhen Institutes of Advanced Technology (China)
Feifei Gu, Shenzhen Institutes of Advanced Technology (China)
Zhan Song, Shenzhen Institutes of Advanced Technology (China)
Juan Zhao, Shenzhen Institutes of Advanced Technology (China)
Jun Li, Guilin Univ. of Electronic Technology (China)


Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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