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Proceedings Paper

Development of grating interferometer-based stroboscopic X-ray tomography
Author(s): Yanlin Wu; Hidekazu Takano; Atsushi Momose
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Paper Abstract

X-ray phase/dark-field tomography by using an X-ray grating interferometer and white synchrotron radiation has been demonstrated to observe dynamics in materials consisting of light elements, because it is available with X-rays of a broad energy bandwidth. In this work, we combined X-ray phase/dark-field tomography with a stroboscopic technique, which synchronizes image acquisitions with repetitive tension applied to a sample. Snapshot images with a 200 μs temporal resolution are measured to reconstruct phase/dark-field tomograms. A result of stroboscopic X-ray dark-field tomography is described, which was obtained for a rubber sample under a 24 Hz repetitive compression-stretch motion of a 10 mm amplitude.

Paper Details

Date Published: 10 September 2019
PDF: 7 pages
Proc. SPIE 11113, Developments in X-Ray Tomography XII, 111130Z (10 September 2019); doi: 10.1117/12.2525576
Show Author Affiliations
Yanlin Wu, Tohoku Univ. (Japan)
Hidekazu Takano, Tohoku Univ. (Japan)
Atsushi Momose, Tohoku Univ. (Japan)


Published in SPIE Proceedings Vol. 11113:
Developments in X-Ray Tomography XII
Bert Müller; Ge Wang, Editor(s)

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