Proceedings Paper
Double pulse LED illumination for phase detection in RGB-interferometry| Format | Member Price | Non-Member Price |
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Paper Abstract
This contribution considers the application of pulsed LED illumination, synchronized with the exposure gap of a CMOS Bayer camera and an oscillating reference mirror, to record two π/2 phase shifted interferograms for quadrature based phase retrieval. Measurements of a superfine roughness standard in lateral motion are presented, demonstrating the capability of the setup to record the surface topography of moving objects. The application of the interferometric measurement data to calibrate a topography measuring wave front sensor, which is employed to support surface unwrapping is also discussed.
Paper Details
Date Published: 21 June 2019
PDF: 12 pages
Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110560T (21 June 2019); doi: 10.1117/12.2525331
Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)
PDF: 12 pages
Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110560T (21 June 2019); doi: 10.1117/12.2525331
Show Author Affiliations
Markus Schake, Univ. Kassel (Germany)
Peter Lehmann, Univ. Kassel (Germany)
Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)
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