
Proceedings Paper
Thermography-inspired processing strategy applied on shearography towards nondestructive inspection of compositesFormat | Member Price | Non-Member Price |
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Paper Abstract
Shearography nondestructive inspection (NDI) based on the use of thermal stress in studied in view of detecting defects in composite materials. In particular, we would like to extract the content of information that is present in the deformation due to the evolving deformation during the variation of the stress. For that a good approach is to try to apply processing techniques which are largely applied in thermography NDI for the same purpose. We will discuss the necessity of pre-processing the shearography data to make them compatible with thermography inspired processing techniques. After that we will present the statistical analysis based on principal components, and we will discuss the possibility of deterministic analysis based on the temporal behavior during and after heating.
Paper Details
Date Published: 21 June 2019
PDF: 11 pages
Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110560G (21 June 2019); doi: 10.1117/12.2525083
Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)
PDF: 11 pages
Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110560G (21 June 2019); doi: 10.1117/12.2525083
Show Author Affiliations
M. Kirkove, Ctr. Spatial de Liège, Univ. de Liège (Belgium)
Y. Zhao, Ctr. Spatial de Liège, Univ. de Liège (Belgium)
P. Blain, Ctr. Spatial de Liège, Univ. de Liège (Belgium)
Y. Zhao, Ctr. Spatial de Liège, Univ. de Liège (Belgium)
P. Blain, Ctr. Spatial de Liège, Univ. de Liège (Belgium)
J.-F. Vandenrijt, Ctr. Spatial de Liège, Univ. de Liège (Belgium)
M. Georges, Ctr. Spatial de Liège, Univ. de Liège (Belgium)
M. Georges, Ctr. Spatial de Liège, Univ. de Liège (Belgium)
Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)
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