
Proceedings Paper
Region of interest detection based on visual saliency analysis and iteratively clustering for remote sensing imagesFormat | Member Price | Non-Member Price |
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Paper Abstract
Saliency analysis is essential to detect common regions of interest (ROI) in remote sensing images. However, many methods imply saliency analysis in single images and cannot detect common ROI accurately. In this paper, we propose the joint saliency analysis based on iterative clustering (JSIC) method to detect common ROIs. Firstly, the size of superpixel patch is adaptively determined by texture feature. Secondly, color feature and intensity feature are utilized to get initial saliency maps and Otsu is utilized to obtain initial ROIs. Finally, iterative clustering is applied to obtain final ROI with less background inference. Quantitative and qualitative experiments results show that the iterative clustering joint saliency analysis method not only has better performance when compared to the other state-of-the-art methods, but also can eliminate image without ROI. Our contributions lie in three aspects as follows: 1) We propose a novel method to calculate the number of superpixel blocks adaptively. 2) A new joint saliency analysis method is proposed based on color feature and intensity feature. 3) We propose a novel saliency modification strategy based on the iterative cluster, which could reduce the background inference and eliminate images without ROIs.
Paper Details
Date Published: 21 June 2019
PDF: 8 pages
Proc. SPIE 11061, Automated Visual Inspection and Machine Vision III, 1106108 (21 June 2019); doi: 10.1117/12.2524701
Published in SPIE Proceedings Vol. 11061:
Automated Visual Inspection and Machine Vision III
Jürgen Beyerer; Fernando Puente León, Editor(s)
PDF: 8 pages
Proc. SPIE 11061, Automated Visual Inspection and Machine Vision III, 1106108 (21 June 2019); doi: 10.1117/12.2524701
Show Author Affiliations
Libao Zhang, Beijing Normal Univ. (China)
Published in SPIE Proceedings Vol. 11061:
Automated Visual Inspection and Machine Vision III
Jürgen Beyerer; Fernando Puente León, Editor(s)
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