Proceedings Paper
Research progress on the application of laser ablation absorption spectroscopy| Format | Member Price | Non-Member Price |
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Paper Abstract
Laser ablation absorption spectroscopy (LAAS) is an analytical technique by combining diode laser absorption spectroscopy (DLAS) with laser ablation (LA) technique. It has been developed to atomize various samples and distinguish elements and isotopes directly without chemical separation. This article reviews the principle and recent research highlights of LAAS technique.
Paper Details
Date Published: 10 May 2019
PDF: 10 pages
Proc. SPIE 11068, Second Symposium on Novel Technology of X-Ray Imaging, 1106827 (10 May 2019); doi: 10.1117/12.2524690
Published in SPIE Proceedings Vol. 11068:
Second Symposium on Novel Technology of X-Ray Imaging
Yangchao Tian; Tiqiao Xiao; Peng Liu, Editor(s)
PDF: 10 pages
Proc. SPIE 11068, Second Symposium on Novel Technology of X-Ray Imaging, 1106827 (10 May 2019); doi: 10.1117/12.2524690
Show Author Affiliations
Hao Ye, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)
Yinbo Huang, Anhui Institute of Optics and Fine Mechanics (China)
Yao Huang, Anhui Institute of Optics and Fine Mechanics (China)
Junxin Zhang, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)
Univ. of Science and Technology of China (China)
Yinbo Huang, Anhui Institute of Optics and Fine Mechanics (China)
Yao Huang, Anhui Institute of Optics and Fine Mechanics (China)
Junxin Zhang, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)
Zhensong Cao, Anhui Institute of Optics and Fine Mechanics (China)
Chen Wang, China Institute of Atomic Energy (China)
Haiping Mei, Anhui Institute of Optics and Fine Mechanics (China)
Chen Wang, China Institute of Atomic Energy (China)
Haiping Mei, Anhui Institute of Optics and Fine Mechanics (China)
Published in SPIE Proceedings Vol. 11068:
Second Symposium on Novel Technology of X-Ray Imaging
Yangchao Tian; Tiqiao Xiao; Peng Liu, Editor(s)
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