
Proceedings Paper
The mid and low-spatial frequency error control technology research during the process with ion-beam figuring in large aperture standard mirrorFormat | Member Price | Non-Member Price |
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Paper Abstract
By the ion-beam figuring machine IBF600, a 630 mm aperture fused silica flat standard mirror was polished up to surface PV value 38.9 nm and RMS 6.556 nm in low frequency error, during the same time ,the mirror’s mid-spatial frequency(spatial frequency band 2.5 mm~33 mm) wavefront RMS error converged to 1.502 nm from initial value 2.022 nm.During the process, two removal functions were used in the simulation after parameter optimization. According to the residual error map, we choose the appropriate removal function and calculate the dwell time, finally we successfully attained the optical acquirements of the standard mirror in both low and middle frequency error, this high middle frequency.
Paper Details
Date Published: 10 May 2019
PDF: 4 pages
Proc. SPIE 11068, Second Symposium on Novel Technology of X-Ray Imaging, 110681T (10 May 2019); doi: 10.1117/12.2524634
Published in SPIE Proceedings Vol. 11068:
Second Symposium on Novel Technology of X-Ray Imaging
Yangchao Tian; Tiqiao Xiao; Peng Liu, Editor(s)
PDF: 4 pages
Proc. SPIE 11068, Second Symposium on Novel Technology of X-Ray Imaging, 110681T (10 May 2019); doi: 10.1117/12.2524634
Show Author Affiliations
Heng Zhu, Chengdu Fine Optical Engineering Research Ctr. (China)
Zhi-gang Li, Chengdu Fine Optical Engineering Research Ctr. (China)
Zhen-jun Bao, Chengdu Fine Optical Engineering Research Ctr. (China)
Zhi-gang Li, Chengdu Fine Optical Engineering Research Ctr. (China)
Zhen-jun Bao, Chengdu Fine Optical Engineering Research Ctr. (China)
Hong-mei Cai, Chengdu Fine Optical Engineering Research Ctr. (China)
Ding-yao Yan, Chengdu Fine Optical Engineering Research Ctr. (China)
Ping Ma, Chengdu Fine Optical Engineering Research Ctr. (China)
Ding-yao Yan, Chengdu Fine Optical Engineering Research Ctr. (China)
Ping Ma, Chengdu Fine Optical Engineering Research Ctr. (China)
Published in SPIE Proceedings Vol. 11068:
Second Symposium on Novel Technology of X-Ray Imaging
Yangchao Tian; Tiqiao Xiao; Peng Liu, Editor(s)
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