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Proceedings Paper

Low-coherence reflectometry in applications to media structure characterization
Author(s): A. A. Isaeva; E. A. Isaeva; S. A. Yuvchenko; D. A. Zimnyakov
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Paper Abstract

Low-coherence reflectometry with the intensity moments analysis in application to laser-pumped dye-doped random medium characterization is discussed in this paper. A fluorescence radiation induced by the laser pumping formed a stochastic interference pattern. The established relationship between the second and third-order moments of multiple scattered fluorescence intensity, the coherence function, and the probability density distribution of the path length differences obtained using the Monte Carlo modeling allows us to characterize the general tendencies relating suppression of the stochastic interference of the quasi-monochromatic light in random multiple scattering media.

Paper Details

Date Published: 3 June 2019
PDF: 5 pages
Proc. SPIE 11066, Saratov Fall Meeting 2018: Laser Physics, Photonic Technologies, and Molecular Modeling, 110660Y (3 June 2019); doi: 10.1117/12.2523215
Show Author Affiliations
A. A. Isaeva, Yuri Gagarin State Technical Univ. of Saratov (Russian Federation)
E. A. Isaeva, Yuri Gagarin State Technical Univ. of Saratov (Russian Federation)
S. A. Yuvchenko, Yuri Gagarin State Technical Univ. of Saratov (Russian Federation)
D. A. Zimnyakov, Yuri Gagarin State Technical Univ. of Saratov (Russian Federation)


Published in SPIE Proceedings Vol. 11066:
Saratov Fall Meeting 2018: Laser Physics, Photonic Technologies, and Molecular Modeling
Vladimir L. Derbov, Editor(s)

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