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Proceedings Paper

The energy control and test in HWIL simulation system of laser jamming CCD sensors based on virtual instrument technology
Author(s): Hua Li; Yanbin Wang; Qianrong Chen; Rongzhen Zhu; Guangsen Ren; Xuanfeng Zhou
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Paper Abstract

According to the demands of laser energy control and test in Hardware-in-the Loop (HWIL) simulation systems for laser jamming CCD sensors effects applications, the laser propagation regulars in the system and the ways to describe laser energy simulations are provided. The basic theoretical analysis to calculate the laser energy distribution in far field and the method to achieve the simulation equipment are also discussed. Based on the Virtual Instrument (VI) technology, the ways for random phase screens formed by multiple layers of atmospheric turbulence as while as wave fronts retrieval based on a spatial Light Modulators(SLMs) set are derived. In the CCD sensors’ jamming effects experiments with different laser parameters such as repeat frequency, the lasers and their energy control equipment were utilized so as to form the distributions of laser light random phase and the undulations of laser beam intension in far field. By using the simulations system, the realization to generate different far field laser propagation effects at real time and to prove the efficiency of the laser energy control and test based on the platform of Windows+ LabVIEW+IMAQ Vision technology in simulations were experienced for CVIs. The analysis of error factors in simulation system was also provided. It is shown that the rhetorical method, devices and the analysis to simulation dynamic effects for laser propagation, which can provide the specialties of real-time, dynamic control, expansibility and can also be applied to beam quality, energy control and test in the HWIL simulation systems for laser jamming CCD sensors experiments.

Paper Details

Date Published: 10 May 2019
PDF: 14 pages
Proc. SPIE 11068, Second Symposium on Novel Technology of X-Ray Imaging, 110680E (10 May 2019); doi: 10.1117/12.2523100
Show Author Affiliations
Hua Li, Luoyang Electronic Equipment Test Ctr. (China)
Yanbin Wang, Luoyang Electronic Equipment Test Ctr. (China)
Qianrong Chen, Luoyang Electronic Equipment Test Ctr. (China)
Rongzhen Zhu, Luoyang Electronic Equipment Test Ctr. (China)
Guangsen Ren, Luoyang Electronic Equipment Test Ctr. (China)
Xuanfeng Zhou, Luoyang Electronic Equipment Test Ctr. (China)


Published in SPIE Proceedings Vol. 11068:
Second Symposium on Novel Technology of X-Ray Imaging
Yangchao Tian; Tiqiao Xiao; Peng Liu, Editor(s)

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