
Proceedings Paper
Deception jamming against Bi-ISAR imaging with VFM waveform via sub-Nyquist samplingFormat | Member Price | Non-Member Price |
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Paper Abstract
Sub-Nyquist sampling jamming has become a common means in ISAR countermeasure to generate multi- false target images. In this paper, sub-Nyquist sampling jamming against bistatic ISAR with V-style modulation (V-FM) signal imaging is presented. The jamming signals, which are formed by the intercepted radar signals under the sub-Nyquist sampling theorem and scattered by moving targets, are collected to achieve high resolution range profile (HRRP) by dual-channel dechirping and take Fourier transform to obtain final false target images, analyze the influence of imaging results by sub-Nyquist sampling rate and bistatic angle. Simulated trails are used to validate the correctness of the analyses and the finally well-focused false-target images greatly support the effectiveness of the sub-Nyquist sampling idea in the countermeasures of VFM Bi-ISAR.
Paper Details
Date Published: 17 April 2019
PDF: 7 pages
Proc. SPIE 11071, Tenth International Conference on Signal Processing Systems, 110710F (17 April 2019); doi: 10.1117/12.2523096
Published in SPIE Proceedings Vol. 11071:
Tenth International Conference on Signal Processing Systems
Kezhi Mao; Xudong Jiang, Editor(s)
PDF: 7 pages
Proc. SPIE 11071, Tenth International Conference on Signal Processing Systems, 110710F (17 April 2019); doi: 10.1117/12.2523096
Show Author Affiliations
Jiyuan Chen, National Univ. of Defense Technology (China)
Xiaoyi Pan, National Univ. of Defense Technology (China)
Zhaoyu Gu, National Univ. of Defense Technology (China)
Xiaoyi Pan, National Univ. of Defense Technology (China)
Zhaoyu Gu, National Univ. of Defense Technology (China)
Qianpeng Xie, National Univ. of Defense Technology (China)
Shunping Xiao, National Univ. of Defense Technology (China)
Shunping Xiao, National Univ. of Defense Technology (China)
Published in SPIE Proceedings Vol. 11071:
Tenth International Conference on Signal Processing Systems
Kezhi Mao; Xudong Jiang, Editor(s)
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