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Proceedings Paper

Commercial application of material-specific baggage screening using x-ray diffraction techniques (Conference Presentation)
Author(s): Jens-Peter Schlomka; Holger Fleckenstein; Dirk Kosciesza; Joerg Meyer

Paper Abstract

Established non-destructive, but penetrating techniques for baggage inspection are primarily based on the transmitted X-ray signal (AT systems, Computed Tomography), which allows determining the objects’ density and average atomic composition. X-ray diffraction is one of the few options to combine the penetrating properties of X-rays with the opportunity to gather material-specific information about the investigated object. While X-ray diffraction for scientific applications is widely used to determine spatial information on molecular level, the application in real-time at high throughput –as required for baggage inspection- has been emerging technology for a few decades now. This presentation will give an overview of the current established and evolving technologies and the required key performance parameters for the application in baggage screening. One realization of a fully 3D baggage screening concept named “X-ray Diffraction Imaging” (XDi) will be described in more detail.

Paper Details

Date Published: 14 May 2019
Proc. SPIE 10999, Anomaly Detection and Imaging with X-Rays (ADIX) IV, 1099907 (14 May 2019); doi: 10.1117/12.2522522
Show Author Affiliations
Jens-Peter Schlomka, Smiths Detection Hamburg (Germany)
Holger Fleckenstein, Smiths Detection Hamburg (Germany)
Dirk Kosciesza, Smiths Detection Hamburg (Germany)
Joerg Meyer, Smiths Detection Hamburg (Germany)

Published in SPIE Proceedings Vol. 10999:
Anomaly Detection and Imaging with X-Rays (ADIX) IV
Amit Ashok; Joel A. Greenberg; Michael E. Gehm, Editor(s)

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