Proceedings Paper
Broadband impedance matching in white cavity| Format | Member Price | Non-Member Price |
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Paper Abstract
We propose a mechanism for increasing the bandwidth of impedance matching in an optical cavity. We demonstrate that placing a compensating medium with abnormal dispersion inside the cavity stretches an optical range by an order of magnitude. As a specific physical system, we consider a double-lambda scheme, where reversible absorption and compensating dispersion could be implemented via two-photon Raman absorption and gain respectively. To prove experimental feasibility of our proposal we study the application of the scheme for an optical quantum storage and provide thorough analysis of possible experimental realizations.
Paper Details
Date Published: 15 March 2019
PDF: 9 pages
Proc. SPIE 11022, International Conference on Micro- and Nano-Electronics 2018, 1102228 (15 March 2019); doi: 10.1117/12.2522448
Published in SPIE Proceedings Vol. 11022:
International Conference on Micro- and Nano-Electronics 2018
Vladimir F. Lukichev; Konstantin V. Rudenko, Editor(s)
PDF: 9 pages
Proc. SPIE 11022, International Conference on Micro- and Nano-Electronics 2018, 1102228 (15 March 2019); doi: 10.1117/12.2522448
Show Author Affiliations
E. S. Moiseev, Kazan Federal Univ. (Russian Federation)
Univ. of Calgary (Canada)
K. I. Gerasimov, Kazan National Research Technical Univ. A.N. Tupoleva (Russian Federation)
M. Sabooni, Univ. of Waterloo (Canada)
Univ. of Tehran (Iran, Islamic Republic of)
Univ. of Calgary (Canada)
K. I. Gerasimov, Kazan National Research Technical Univ. A.N. Tupoleva (Russian Federation)
M. Sabooni, Univ. of Waterloo (Canada)
Univ. of Tehran (Iran, Islamic Republic of)
A. Tashchilina, Univ. of Calgary (Canada)
S. A. Moiseev, Kazan National Research Technical Univ. A.N. Tupoleva (Russian Federation)
S. A. Moiseev, Kazan National Research Technical Univ. A.N. Tupoleva (Russian Federation)
Published in SPIE Proceedings Vol. 11022:
International Conference on Micro- and Nano-Electronics 2018
Vladimir F. Lukichev; Konstantin V. Rudenko, Editor(s)
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