
Proceedings Paper
Noise characteristics and localisation precision in ultrafast interferometric scattering (iSCAT) microscopyFormat | Member Price | Non-Member Price |
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Paper Abstract
Biology is a fundamental scientific field which has made significant progress over the course of recent centuries and with the help of modern microscopy techniques, major discoveries are still being made today. The time span of processes such as protein dynamics ranges from slow to extremely fast. That is why high temporal resolution has recently become one of the desired parameters in biological experiments. The improvement of ultrafast image acquisition technology can help us to achieve higher temporal resolutions than before and detailed biological processes of rapid nature can now be observed. With these possibilities comes a desire to determine the noise characteristics of ultrafast cameras to set the limitations in localization precision in tracking of biological objects and their labels, which is the focus of this manuscript.
Paper Details
Date Published: 11 April 2019
PDF: 4 pages
Proc. SPIE 11028, Optical Sensors 2019, 110282S (11 April 2019); doi: 10.1117/12.2522407
Published in SPIE Proceedings Vol. 11028:
Optical Sensors 2019
Francesco Baldini; Jiri Homola; Robert A. Lieberman, Editor(s)
PDF: 4 pages
Proc. SPIE 11028, Optical Sensors 2019, 110282S (11 April 2019); doi: 10.1117/12.2522407
Show Author Affiliations
M. Čičala, Institute of Photonics and Electronics of the CAS, v.v.i. (Czech Republic)
M. Vala, Institute of Photonics and Electronics of the CAS, v.v.i. (Czech Republic)
M. Vala, Institute of Photonics and Electronics of the CAS, v.v.i. (Czech Republic)
L. Bujak, Institute of Photonics and Electronics of the CAS, v.v.i. (Czech Republic)
M. Piliarik, Institute of Photonics and Electronics of the CAS, v.v.i. (Czech Republic)
M. Piliarik, Institute of Photonics and Electronics of the CAS, v.v.i. (Czech Republic)
Published in SPIE Proceedings Vol. 11028:
Optical Sensors 2019
Francesco Baldini; Jiri Homola; Robert A. Lieberman, Editor(s)
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