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Proceedings Paper

Spatial selectivity and sensitivity measurement of optoelectronic devices by scanning microscopy
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Paper Abstract

Avalanche Photodetectors (APDs) with high dynamic ranges are tested with scanning microscopy to reveal their sensitivity towards the components optoelectronic spatial design. The measurement will unveil design flaws of typical APD design approaches and suggest improvements. In the end, the specification of the component will be discussed under the issued findings. optical induced current.

Paper Details

Date Published: 11 April 2019
PDF: 10 pages
Proc. SPIE 11028, Optical Sensors 2019, 110282I (11 April 2019); doi: 10.1117/12.2522265
Show Author Affiliations
Urs Zywietz, Valeo Schalter und Sensoren GmbH (Germany)
Sercan Çabuk, Valeo Schalter und Sensoren GmbH (Germany)
Mosaddek Hossain, Valeo Schalter und Sensoren GmbH (Germany)
Thorsten Beuth, Valeo Schalter und Sensoren GmbH (Germany)


Published in SPIE Proceedings Vol. 11028:
Optical Sensors 2019
Francesco Baldini; Jiri Homola; Robert A. Lieberman, Editor(s)

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