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Proceedings Paper

Spectrally-resolved interferometric imaging by very large-scale silicon-photonic integrated circuits (VLSPIC) (Conference Presentation)
Author(s): S. J. Ben Yoo

Paper Abstract

This paper discusses design, fabrication, and experimental demonstration of very large-scale silicon photonic integrated circuits (VLSPIC) that include spectrometers, interferometers, and phase tuners to reconstruct spectrally resolved images. Recently-fabricated VLSPICs included 18 spectral bins and 12 baselines, successfully reconstructing reference images.

Paper Details

Date Published: 14 May 2019
PDF
Proc. SPIE 10980, Image Sensing Technologies: Materials, Devices, Systems, and Applications VI, 109800O (14 May 2019); doi: 10.1117/12.2522152
Show Author Affiliations
S. J. Ben Yoo, Univ. of California, Davis (United States)


Published in SPIE Proceedings Vol. 10980:
Image Sensing Technologies: Materials, Devices, Systems, and Applications VI
Nibir K. Dhar; Achyut K. Dutta; Sachidananda R. Babu, Editor(s)

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