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Proceedings Paper

Multiphoton subtracted thermal states: description, preparation, measurement and utilization
Author(s): K. G. Katamadze; G. V. Avosopiants; B. I. Bantysh; Yu. I. Bogdanov; S. P. Kulik
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Paper Abstract

Photon creation and annihilation are two basic operators in quantum optics. Their experimental implementation provides a perfect toolbox for quantum state engineering. The simplest quantum states, which can be modified both by photon creation and annihilation are thermal states of light. Therefore, the multiphoton subtracted thermal states (MPSTS) draw attention of quantum optics experimentalists last decade. Despite its simplicity they serve as a good testing area for study of a number of quantum phenomena. In the current work we give a review of the recent works related to MPSTS: their theoretical description, preparation and measurement technique and their utilization as a testing area for studying some quantum phenomena like non-Gaussianity, Photonic Maxwell‟s Demon, Quantum Vampire and so on.

Paper Details

Date Published: 15 March 2019
PDF: 11 pages
Proc. SPIE 11022, International Conference on Micro- and Nano-Electronics 2018, 110222K (15 March 2019); doi: 10.1117/12.2522080
Show Author Affiliations
K. G. Katamadze, Institute of Physics and Technology (Russian Federation)
M.V. Lomonosov Moscow State Univ. (Russian Federation)
National Research Nuclear Univ. (Russian Federation)
G. V. Avosopiants, M.V. Lomonosov Moscow State Univ. (Russian Federation)
National Research Univ. of Electronic Technology (Russian Federation)
B. I. Bantysh, Institute of Physics and Technology (Russian Federation)
National Research Univ. of Electronic Technology (Russian Federation)
Yu. I. Bogdanov, Institute of Physics and Technology (Russian Federation)
National Research Nuclear Univ. (Russian Federation)
National Research Univ. of Electronic Technology (Russian Federation)
S. P. Kulik, M.V. Lomonosov Moscow State Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 11022:
International Conference on Micro- and Nano-Electronics 2018
Vladimir F. Lukichev; Konstantin V. Rudenko, Editor(s)

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